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Pirooz Marashi
  Courses 

 Advanced Methods of Materials Analysis(SPRING_2019)

Aims:

Describing advanced methods of materials analysis, especially those that have more applications in research projects

Syllabus:

  • Introduction to materials analysis and the classification of different methods based on working principles and types of data they can provide
  • Elemental analysis based on absorption optical spectroscopy: atomic absorption spectroscopy, optical absorption spectroscopy
  • Elemental analysis based on optical emission spectroscopy: flame emission spectroscopy, glow discharge spectroscopy, spark emission spectroscopy, inductive plasma spectroscopy
  • X-Ray Florescence Spectroscopy
  • X-Ray analysis in electron microscopes
  • X-ray diffraction
  • Electron diffraction
  • Transmission electron microscopy
  • TEM sample preparation
  • Scanning electron microscopy
  • SEM sample preparation
  • Surface analysis methods: XPS, AES
  • Secondary Ion Mass Spectrocpy
  • Thermal analysis methods, DTA, DSC,TG, Dilatometry
  • Vibrational Spectroscopy: FTIR, Raman
  • Particle size analyzers

Text Book:

  • Peter J. Goodhew, John Humphreys, Richard Beanland, Electron Microscopy and Analysis, Taylor and Francis, London and New York, 2001
  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 Crystallography and Laboratory(SPRING_2019)

Aims:

Introducing different structures of crystalline material, their properties and the characterization methods

Syllabus:

  • Crystal systems
  • Bravais lattice
  • Crystal structures
  • Crystallographic directions
  • Crystallographic planes
  • Lattice holes
  • Ceramic crystal structures
  • Stereographic projection
  • Indexing stereographic image
  • Crystal symmetry
  • X-Ray and its application in crystallography: X-Ray
  • Transmission Electron Microscopy, Electron Diffraction
  • Liquid Crystals
  • Introduction to the science and technology of materials
  • Atomic structure and atomic binding

Text Book:

  • Materials Science and Engineering, An Introduction, William D. Callister, Jr., John Wiley & Sons, Inc., 2008 Crystals and Crystal Structures, Richard J. D. Tilley, John Wiley & Sons, Inc., 2006 B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, 3rd Ed., Prentice Hall, Inc., 2001. D. R. Askeland, P.P. Fulay, The Science and Engineering of Materials, Thomson Engineering Company, 5th ed., 2006.


 Lab of Advanced Methods of Materials Analysis(SPRING_2019)

Aims:

Practical training for some of the new charachterization methods

Syllabus:

  • Atomic absorption spectroscopy
  • Optical absorption spectroscopy
  • X-Ray Florescence Spectroscpy
  • X-Ray Diffraction
  • Scanning Electron Microscopy

Text Book:

  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 Special Topics (Materials Characterization and Analysis Techniques((SPRING_2019)

Aims:

1. Introducing analysis principles, 2. Analysis methods, 3. Selecting the right method

Syllabus:

  • Importance of analysis
  • Elementary statistics
  • Balances
  • Titration
  • Instrumental Analysis
  • Spectroscopy
  • Vibrational Spectroscopy
  • Atomic absorption
  • XRF
  • XRD
  • Microscopy
  • Thermal analysis
  • BET
  • Particle size analyzing

Text Book:

  • John Kenke, Analytical Chemistry for Technicians, 4th ed., CRC Press, 2014


 Advanced Methods of Materials Analysis(FALL_2018)

Aims:

Describing advanced methods of materials analysis, especially those that have more applications in research projects

Syllabus:

  • Introduction to materials analysis and the classification of different methods based on working principles and types of data they can provide
  • Elemental analysis based on absorption optical spectroscopy: atomic absorption spectroscopy, optical absorption spectroscopy
  • Elemental analysis based on optical emission spectroscopy: flame emission spectroscopy, glow discharge spectroscopy, spark emission spectroscopy, inductive plasma spectroscopy
  • X-Ray Florescence Spectroscopy
  • X-Ray analysis in electron microscopes
  • X-ray diffraction
  • Electron diffraction
  • Transmission electron microscopy
  • TEM sample preparation
  • Scanning electron microscopy
  • SEM sample preparation
  • Surface analysis methods: XPS, AES
  • Secondary Ion Mass Spectrocpy
  • Thermal analysis methods, DTA, DSC,TG, Dilatometry
  • Vibrational Spectroscopy: FTIR, Raman
  • Particle size analyzers

Text Book:

  • Peter J. Goodhew, John Humphreys, Richard Beanland, Electron Microscopy and Analysis, Taylor and Francis, London and New York, 2001
  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 Crystallography and Laboratory(FALL_2018)

Aims:

Introducing different structures of crystalline material, their properties and the characterization methods

Syllabus:

  • Introduction to the science and technology of materials
  • Atomic structure and atomic binding
  • Crystal systems
  • Bravais lattice
  • Crystal structures
  • Crystallographic directions
  • Crystallographic planes
  • Lattice holes
  • Ceramic crystal structures
  • Stereographic projection
  • Indexing stereographic image
  • Crystal symmetry
  • X-Ray and its application in crystallography: X-Ray
  • Transmission Electron Microscopy, Electron Diffraction
  • Liquid Crystals

Text Book:

  • Materials Science and Engineering, An Introduction, William D. Callister, Jr., John Wiley & Sons, Inc., 2008 Crystals and Crystal Structures, Richard J. D. Tilley, John Wiley & Sons, Inc., 2006 B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, 3rd Ed., Prentice Hall, Inc., 2001. D. R. Askeland, P.P. Fulay, The Science and Engineering of Materials, Thomson Engineering Company, 5th ed., 2006.


 Lab of Advanced Methods of Materials Analysis(FALL_2018)

Aims:

Practical training for some of the new charachterization methods

Syllabus:

  • Atomic absorption spectroscopy
  • Optical absorption spectroscopy
  • X-Ray Florescence Spectroscpy
  • X-Ray Diffraction
  • Scanning Electron Microscopy

Text Book:

  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 New Technique in Material Analysis(FALL_2018)

Aims:

Introducing New Analysis Methods, describing different concepts in analyzing, possible analyzing methods and their applications in research and industries

Syllabus:

  • Introduction to materials analysis
  • Introducing different analysis methods based on working principals, type of data they are providing (elemental, phase (crystalline/amorphous), molecular, microstructure), and their range of abilities
  • General components of analyzing systems: probes, signals, analyzers, detectors and displays
  • Introduction to Optical Spectroscopy for Elemental Analysis
  • Introducing different instruments for Elemental Analysis by Optical Spectroscopy
  • X-Ray generation and its interaction with the sample
  • Electromagnetic diffraction and analysis of periodic structures
  • Microscopy, main concepts: magnification, resolution, depth of field, topography
  • Introducing different microscopes: transmission and reflection, optical and scanning
  • Electron-sample interactions
  • Introducing scanning electron microscope
  • Sample preparation for scanning electron microscopy
  • Introducing transmission electron microscope
  • Sample preparation for transmission electron microscope
  • Scanning probe microscopes
  • Other analysis methods

Text Book:

  • P. Marashi, S. Kaviani, H. Sarpoolaky, A Zolfaghari, Principals and applications of electron microscopes and new analysis methods, tools to explore nano-world, Iran University of Science and Technology, 3rd Ed., 2012
  • F. Glestani-Fard, A Bahrevar, E. Salahi, Materials Characterization and Analysis Methods, Iran University of Science and Technology, 2004


 Advanced Methods of Materials Analysis(SPRING_2018)

Aims:

Describing advanced methods of materials analysis, especially those that have more applications in research projects

Syllabus:

  • Introduction to materials analysis and the classification of different methods based on working principles and types of data they can provide
  • Elemental analysis based on absorption optical spectroscopy: atomic absorption spectroscopy, optical absorption spectroscopy
  • Elemental analysis based on optical emission spectroscopy: flame emission spectroscopy, glow discharge spectroscopy, spark emission spectroscopy, inductive plasma spectroscopy
  • X-Ray Florescence Spectroscopy
  • X-Ray analysis in electron microscopes
  • X-ray diffraction
  • Electron diffraction
  • Transmission electron microscopy
  • TEM sample preparation
  • Scanning electron microscopy
  • SEM sample preparation
  • Surface analysis methods: XPS, AES
  • Secondary Ion Mass Spectrocpy
  • Thermal analysis methods, DTA, DSC,TG, Dilatometry
  • Vibrational Spectroscopy: FTIR, Raman
  • Particle size analyzers

Text Book:

  • Peter J. Goodhew, John Humphreys, Richard Beanland, Electron Microscopy and Analysis, Taylor and Francis, London and New York, 2001
  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 Crystallography and Laboratory(SPRING_2018)

Aims:

Introducing different structures of crystalline material, their properties and the characterization methods

Syllabus:

  • Crystal systems
  • Bravais lattice
  • Crystal structures
  • Crystallographic directions
  • Crystallographic planes
  • Lattice holes
  • Ceramic crystal structures
  • Stereographic projection
  • Indexing stereographic image
  • Crystal symmetry
  • X-Ray and its application in crystallography: X-Ray
  • Transmission Electron Microscopy, Electron Diffraction
  • Liquid Crystals
  • Introduction to the science and technology of materials
  • Atomic structure and atomic binding

Text Book:

  • Materials Science and Engineering, An Introduction, William D. Callister, Jr., John Wiley & Sons, Inc., 2008 Crystals and Crystal Structures, Richard J. D. Tilley, John Wiley & Sons, Inc., 2006 B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, 3rd Ed., Prentice Hall, Inc., 2001. D. R. Askeland, P.P. Fulay, The Science and Engineering of Materials, Thomson Engineering Company, 5th ed., 2006.


 Lab of Advanced Methods of Materials Analysis(SPRING_2018)

Aims:

Practical training for some of the new charachterization methods

Syllabus:

  • Atomic absorption spectroscopy
  • Optical absorption spectroscopy
  • X-Ray Florescence Spectroscpy
  • X-Ray Diffraction
  • Scanning Electron Microscopy

Text Book:

  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 New Technique in Material Analysis(SPRING_2018)

Aims:

Introducing New Analysis Methods, describing different concepts in analyzing, possible analyzing methods and their applications in research and industries

Syllabus:

  • Introduction to materials analysis
  • Introducing different analysis methods based on working principals, type of data they are providing (elemental, phase (crystalline/amorphous), molecular, microstructure), and their range of abilities
  • General components of analyzing systems: probes, signals, analyzers, detectors and displays
  • Introduction to Optical Spectroscopy for Elemental Analysis
  • Introducing different instruments for Elemental Analysis by Optical Spectroscopy
  • X-Ray generation and its interaction with the sample
  • Electromagnetic diffraction and analysis of periodic structures
  • Microscopy, main concepts: magnification, resolution, depth of field, topography
  • Introducing different microscopes: transmission and reflection, optical and scanning
  • Electron-sample interactions
  • Introducing scanning electron microscope
  • Sample preparation for scanning electron microscopy
  • Introducing transmission electron microscope
  • Sample preparation for transmission electron microscope
  • Scanning probe microscopes
  • Other analysis methods

Text Book:

  • F. Glestani-Fard, A Bahrevar, E. Salahi, Materials Characterization and Analysis Methods, Iran University of Science and Technology, 2004
  • P. Marashi, S. Kaviani, H. Sarpoolaky, A Zolfaghari, Principals and applications of electron microscopes and new analysis methods, tools to explore nano-world, Iran University of Science and Technology, 3rd Ed., 2012


 Advanced Methods of Materials Analysis(FALL_2017)

Aims:

Describing advanced methods of materials analysis, especially those that have more applications in research projects

Syllabus:

  • Introduction to materials analysis and the classification of different methods based on working principles and types of data they can provide
  • Elemental analysis based on absorption optical spectroscopy: atomic absorption spectroscopy, optical absorption spectroscopy
  • Elemental analysis based on optical emission spectroscopy: flame emission spectroscopy, glow discharge spectroscopy, spark emission spectroscopy, inductive plasma spectroscopy
  • X-Ray Florescence Spectroscopy
  • X-Ray analysis in electron microscopes
  • X-ray diffraction
  • Electron diffraction
  • Transmission electron microscopy
  • TEM sample preparation
  • Scanning electron microscopy
  • SEM sample preparation
  • Surface analysis methods: XPS, AES
  • Secondary Ion Mass Spectrocpy
  • Thermal analysis methods, DTA, DSC,TG, Dilatometry
  • Vibrational Spectroscopy: FTIR, Raman
  • Particle size analyzers

Text Book:

  • Peter J. Goodhew, John Humphreys, Richard Beanland, Electron Microscopy and Analysis, Taylor and Francis, London and New York, 2001
  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 Crystallography and Laboratory(FALL_2017)

Aims:

Introducing different structures of crystalline material, their properties and the characterization methods

Syllabus:

  • Introduction to the science and technology of materials
  • Atomic structure and atomic binding
  • Crystal systems
  • Bravais lattice
  • Crystal structures
  • Crystallographic directions
  • Crystallographic planes
  • Lattice holes
  • Ceramic crystal structures
  • Stereographic projection
  • Indexing stereographic image
  • Crystal symmetry
  • X-Ray and its application in crystallography: X-Ray
  • Transmission Electron Microscopy, Electron Diffraction
  • Liquid Crystals

Text Book:

  • Materials Science and Engineering, An Introduction, William D. Callister, Jr., John Wiley & Sons, Inc., 2008 Crystals and Crystal Structures, Richard J. D. Tilley, John Wiley & Sons, Inc., 2006 B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, 3rd Ed., Prentice Hall, Inc., 2001. D. R. Askeland, P.P. Fulay, The Science and Engineering of Materials, Thomson Engineering Company, 5th ed., 2006.


 Lab of Advanced Methods of Materials Analysis(FALL_2017)

Aims:

Practical training for some of the new charachterization methods

Syllabus:

  • Atomic absorption spectroscopy
  • Optical absorption spectroscopy
  • X-Ray Florescence Spectroscpy
  • X-Ray Diffraction
  • Scanning Electron Microscopy

Text Book:

  • B. D. Cullity and S. R. Stock, Elements of X-Ray Diffraction, Prentice Hall, Inc., 3rd Edition., 2001.


 New Technique in Material Analysis(FALL_2017)

Aims:

Introducing New Analysis Methods, describing different concepts in analyzing, possible analyzing methods and their applications in research and industries

Syllabus:

  • Introduction to materials analysis
  • Introducing different analysis methods based on working principals, type of data they are providing (elemental, phase (crystalline/amorphous), molecular, microstructure), and their range of abilities
  • General components of analyzing systems: probes, signals, analyzers, detectors and displays
  • Introduction to Optical Spectroscopy for Elemental Analysis
  • Introducing different instruments for Elemental Analysis by Optical Spectroscopy
  • X-Ray generation and its interaction with the sample
  • Electromagnetic diffraction and analysis of periodic structures
  • Microscopy, main concepts: magnification, resolution, depth of field, topography
  • Introducing different microscopes: transmission and reflection, optical and scanning
  • Electron-sample interactions
  • Introducing scanning electron microscope
  • Sample preparation for scanning electron microscopy
  • Introducing transmission electron microscope
  • Sample preparation for transmission electron microscope
  • Scanning probe microscopes
  • Other analysis methods

Text Book:

  • P. Marashi, S. Kaviani, H. Sarpoolaky, A Zolfaghari, Principals and applications of electron microscopes and new analysis methods, tools to explore nano-world, Iran University of Science and Technology, 3rd Ed., 2012
  • F. Glestani-Fard, A Bahrevar, E. Salahi, Materials Characterization and Analysis Methods, Iran University of Science and Technology, 2004


 
 
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